Abstract
Ferromagnetic Resonance (FMR) of Epitaxial Fept Thin Films with in-Plane Magnetization Was Investigated by Measuring the Reflection Coefficient (S11) Using Coplanar Waveguides. FMR Signals of Four Fept Films Grown on Mgo (001) Substrates with Different Post-Annealing Temperatures Were Measured, and the Resonant Peaks of Fept Were Successfully Observed. Annealing Temperature Dependence Was Found in the Peak Frequency Shift Depending on the Magnetic Field Applied in the Film-Plane, which Is Attributable to the Difference of Magnetic Anisotropy of Fept Thin Films.
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