Abstract
X-band Ferromagnetic Resonance(FMR) has been employed to investigate the angular variation of resonance fields of DC sputtered Co-Cr films with different substrate deposition temperatures. This angular variation has been fitted with the classical uniaxial anisotropy crystal model and yields values of 2 K 1 M−4π M = -4∼−7 KOe, 4K 2 = -0.8∼ 0.8 KOe and g-factor = 2.3 ∼ 2.8. The FMR measurements of the first anisotropy constant are quite different from the results obtained with Vibrating Sample Magnetometer(VSM). This discrepancy is interpreted as a result of the formation of two ferromagnetic phases. With this simple model, the substrate temperature dependence of first anisotropy is explained and it is predicted that a lower substrate temperature will improve the Co-Cr films for their potential application in perpendicular magnetic recording devices.
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