Abstract
Amorphous GdxFe1−x films with 0.20 ≤ x≤ 0.40, mostly of 200 nm in thickness, are prepared by means of flash evaporation technique. The films are studied by ferromagnetic resonance FMR. They are found to exhibit some inhomogeneities in composition. The compositions of the inhomogeneous thin films of Gd-Fe alloys are found from the values of eff and their dependence on Gd concentration. An angular variation analysis of the FMR spectrum is performedfor diverse composition regions in the film, where the observed FMR lines are sharpened. Amorphe GdxFe1−x−Schichten mit 0,20 ≤ x ≤ 0,40, die meisten 200 nm dick, werden mittels Blitz-Aufdampfungstechnik hergestellt. Diese Schichten werden mittels ferromagnetischer Resonanz, FMR, untersucht. Es wird gefunden, das sie einige Zusammensetzungsinhomogenitaten zeigen. Die Zusammensetzungder inhomogenen dunnen Schichten der GdFe-Legierungen werden aus den eff-Werten und deren Abhangigkeit von der Gd-Konzentration bestimmt. Eine Winkel-anderungsanalyse des FMR-Spektrums wird fur mehrere Zusammensetzungsbereiche in der Schicht durchgefuhrt, wo die beobachteten FMR-Linien verschmalert sind.
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