Abstract
The ferromagnetic resonance linewidth in polycrystalline insulators contains contributions which arise from intrinsic and extrinsic properties of the material and also from the electromagnetic perturbations of the resonant cavity. Contribution to the relaxation frequency due to anisotropy, porosity, and surface pits are well-known. Cavity measurements introduce two additional sources of electromagnetic nature which had not been hitherto analyzed satisfactorily. These arise from eddy currents induced in the cavity wall due to the proximity of the precessing dipoles and nonuniformity of the rf-field over the volume occupied by the sample. The analysis involving all these contributions leads to a diameter dependence of the relaxation frequency. This prediction of the theory has been satisfactorily verified by experiments on a number of samples with widely varying saturation magnetization. An attempt has also been made to obtain the intrinsic linewidth using this analysis and to compare it with the reported linewidths in single crystals.
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