Abstract
The process of the nucleation and evolution of the ferromagnetic phase in the thin Fe49Rh51 film on a MgO substrate near the phase transition from the antiferromagnetic (AFM) to the ferromagnetic (FM) state was comprehensively characterized by means of measurements of the temperature, time and magnetic field dependences of the magnetization. The observed relaxation processes of magnetization indicate the nucleation of the FM phase on the film surface and its further growth towards the film-substrate interface upon heating or applying the external magnetic field. The confirmation and verification of the FM phase growth evolution were carried out by the methods of vibrational magnetometry and magnetic force microscopy. A phenomenological model described the evolution of the FM phase growth in thin films based on the Bean-Rodbell and Kolmogorov-Johnson-Mehl-Avrami (KJMA) models is proposed. The article presents a new approach for interpreting Temperature First Order Reversal Curve (TFORC) diagrams based on comparative analysis of the coercivity and squareness coefficient temperature dependences and the peak position on the diagram.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
