Abstract
PbZr0.40Ti0.60O3/La x Sr1 − x CoO3 (PZT/LSCO) heterostructures have been grown on Si-based substrates by chemical solution routes. X-ray diffraction analysis showed that PZT on LSCO are polycrystalline with (110) orientation and entirely perovskite phase. The resistance of LSCO is strongly affected by the ratio of La/Sr and the annealing atmosphere for the LSCO thin films. The ferroelectricity of PZT is strongly dependent on LSCO electrode, the P-E hystersis loops of PZT deposited on LSCO which annealed in air is more asymmetry than that annealed in oxygen. At the applied electric field of 300 kV/cm, all PZT films have the resisitivity larger than 1010 Ω · cm. The fatigue resistance is strongly affected by the resistance of the LSCO electrode. The ferroelctric properties are strongly improved by LSCO buffer layer between PZT and Pt bottom electrode.
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