Ferroelectric properties of highly a-oriented polycrystalline Bi4Ti3O12 thin films grown on glass substrates

Abstract

Thin films of highly a-oriented polycrystalline Bi4Ti3O12 (BTO) were deposited on Pt/Ta/glass substrates via pulsed laser deposition. X-ray diffraction experiments confirmed that the BTO thin films were preferentially oriented along the (104) direction. As a ferroelectric thin film, the BTO thin films exhibited good ferroelectric properties with a remanent polarization of 13.8 μC/cm2. The fatigue resistance test revealed that owing to their crystal orientation along the (104) direction, the BTO thin films significantly degrade after being subjected to ferroelectric polarization after around 108 switching cycles.