Abstract
In this paper, the surface crystalline morphology and piezoelectricity of P(VDF/TrFE)(72/28) copolymer ultrathin films were studied using different scanning probe microscopy (SPM) techniques. Atomic force microscopy (AFM) was used to study the changes in their crystalline morphology with varying temperature conditions. From electric force microscopy (EFM) studies, the change in dipole moment vectors along the applied field direction and the resultant change in amplitude image for '1 or 0' state were monitored and used to 'write/erase and read' the data on the memory bit. These results indicate the possibility of using SPM-based high density data storage with these copolymer ultrathin films.
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