Abstract
The optical diffraction limit is rigidly determined as a simple equation of wavelengthλ and lens numerical aperture NA (): λ/2/NA. In this paper,we report that Ag5.8In4.4Sb61.0Te28.8 and Ge2Sb2Te5 chalcogenide thin films, which are typical of optical recording materialsused in digital versatile discs (DVDs), enable a resolution of underλ/10 due to their ferroelectricproperties. In the Ag5.8In4.4Sb61.0Te28.8 film it was found that this optical super-resolution can be observed between 350 and400 °C, resulting in a second phase transition from a hexagonal (A7 belonging to ) to a rhombohedral structure ofR32 orR3m.In Ge2Sb2Te5, on the other hand, the temperature range is much wider, between 250 and450 °C, which is also due to a second phase transition from a NaCl-type fcc to a hexagonalstructure.
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