Abstract
The SrTi0.9Fe0.1O3−δ thin film grown on the LaNiO3 coated Si(100) substrates was prepared by a sol–gel process. The structure, micrograph, chemical states, electrical and magnetic properties of the thin film were investigated by using X-ray diffractometor (XRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), ferroelectric test system and vibrating sample magnetometer (VSM), respectively. The results showed that the ferroelectric properties with the saturated polarization (2Ps), remanent polarization (2Pr) and coercive field (2Ec) of 12.3μC/cm2, 1.58μC/cm2 and 33kV/cm, respectively, at applied field of 200kV/cm. The average remnant magnetization (Mr) and saturated magnetization (Ms) of the thin film were 3.74×10−2 and 9.22×10−2emu/cm3, respectively. Both the ferroelectric and ferromagnetic properties could be explained by the defect induced and the Fe ion substitution. Such multiferroic thin film was appropriate to be used in the field of multiferroic devices.
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