Abstract
In the present work, Li-doped ZnO nanorods have been deposited onto SiO2 glass substrates by the simple and economical Chemical Bath Deposition method. These layers were further characterized in terms of structural, morphological, dielectric and ferroelectric properties as a function of Li content. X-ray diffraction patterns revealed the highly c-oriented hexagonal wurtzite structure of the films. Both dielectric measurements and ferroelectric investigations at nano- and micro-scale pointed out the existence of a ferroelectric behavior in such doped ZnO nanostructures. This ferroelectric activity can be further enhanced by increasing the dopant content in the material.
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