Abstract
Based on the study of GaAs photocathode, the carrier dynamics of reflection-mode GaAlAs photocathode has been investigated. In this paper, the reflection-mode GaAlAs/GaAs photocathode is grown by metal organic chemical vapor deposition (MOCVD) epitaxial technology. The femtosecond pump-probe spectroscopy is performed to measure carrier dynamics in GaAlAs and GaAs photocathods. After laser excitation the surfaces of GaAlAs/GaAs photocathode, the reflectivity of photocathode surface is changed. At the same time, the dynamic processes of the non-equilibrium carrier distribution in semiconductor material is obtained by the transient reflectance spectrum. Compared with GaAs photocathode, the Al element in GaAlAs photocathode is unfavorable to photoemission under some conditions, while it solves the problem that the spectrum response range of binary compounds is not adjustable. The change trend of initial relaxation transient of GaAs photocathode in the 22 ps range is the same as GaAlAs, while the change of GaAs and GaAlAs relaxation state is significantly different with the change of delay time after 22 ps. The results show that the GaAlAs increases band gap due to a significantly slower than GaAs photocathode in initial process. Meanwhile, this paper provides a reference for the preparation of the GaAlAs photocathode that only respond to blue and green light range.
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