Abstract
Damage tests of the ultrashort pulse compression gratings were implemented by an 800 nm laser with a pulse width of 40–100 fs. The damaged character of grating ridges demonstrates that laser damage of gratings is closely related to total deposited energy in grating ridges. The average electric field strength in grating ridges is naturally proposed to calculate the theoretical threshold based on the electron production model via photoionization and avalanche ionization, which makes theoretical and experimental results consistent. The results indicate that laser damage resistance of a grating can be evaluated by the average electric field in grating ridges.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
