Femtometer-resolved wavelength monitor based on photodiode optoelectronic chromatic dispersion with RF phase-shift amplification.

Abstract

The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of G=4⋅104, a peak phase-shift sensitivity of Δθ = 27deg/pm is achieved, corresponding to a spectral resolution of Δλres = 1fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.