Abstract
Quantum dot (QD) is slated to play a significant role in quantum technologies through its usage as a single-photon source. It also has promising applications as efficient light emitters through strain-relaxed structures. This work demonstrates the fabrication of high-quality site controlled InGaN/GaN QDs through a large contribution of chemical etching in an otherwise reactive ion etching process. Uniform sized QDs with a hexagonal base and radii of 15 and 6 nm are fabricated and characterized by photoluminescence and femtosecond transient absorption spectroscopy. The natural exposition of the inherent hexagonal base is a signature of the reduced defects in these dots. The QDs show the intuitive additional quantum confinement due to size reduction, and the photoluminescence peaks manifest a blue shift. The absorption spectra indicate that the QDs are heavily strain-relaxed at smaller radii, and their characteristics as a function of size and pump power are investigated. The degree of strain relaxation and change in energy-band diagram as a function of position along the radius are also determined. The changes are prominent near the periphery, which creates a natural potential well for both electrons and holes, restricting the carriers from reaching the sidewalls. Femtosecond carrier dynamics indicate a lower capture rate for the smaller size of the dots, indicating excessive electrical or optical pumping will not necessarily lead to increased luminescence. The radiative decay of carriers is faster for strain-relaxed QDs due to higher oscillator strength originating from increased electron–hole wave function overlap. Higher pump power is found to decrease the radiative rate due to the increased effective size of the QDs and thereby reducing carrier injection density. This is in stark contrast to the frequently observed increased decay rate due to Auger recombination. Dynamic modification of the size of the QDs by pump power may find potential use in optoelectronic applications.
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