Abstract
Internal short-circuit is the most dangerous abusive condition for Li-ion batteries and has been the root cause for several catastrophic accidents involving Li-ion batteries in recent years. Large-format Li-ion batteries are particularly vulnerable to internal short-circuits because of high energy content. Nail penetration test is commonly used to study the internal short-circuits, but the test results usually have poor reproducibility and offer limited insight. This paper deals with a possibility of numerical simulation of internal short circuit test using FEM.
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