Abstract
The structural relaxation of an amorphous Fe79B16Si5 alloy was studied through electrical resistivity measurements. The alloy obtained by rapid quenching relaxes to a certain structure during isothermal annealing at temperatures below crystallization temperature, Tx=778 K. The structure was rather stable under the experimental condition adopted here. The irreversible decrease of resistivity and increase of its temperature coefficient were observed during the structural relaxation. These changes can be caused by the changes in topological short range order (TSRO) that involves the elimination and redistribution of quenched-in excess free volume. For the specimen pre-annealed at 673 K for 10.8 ks, reversible changes in resistivity was observed during the continuous heat cycles consisting of heating at the rate of 0.083 K/s and air cooling between 299 K and 673 K.
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