Abstract
The kinetics of electrical damage (breakdown) of polymer films 20–50 μm thick in a constant-sign field of 0.5–0.6 GV/m at 77–300 K has been studied. At elevated temperatures (250–300 K), the exponential temperature dependence of the durability and the above-barrier thermal-fluctuation mechanism of electron emission from traps, i.e., space charge accumulation leading to breakdown, take place. At low temperatures (77–200 K), there are separate local decreases in the durability (minima) at the athermal durability level. The identity of the temperatures of durability minima and measured thermoluminescence maxima of polymers was found. A conclusion is made about the mechanism of thermally stimulated tunneling (subbarrier emission) of electrons from traps.
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