Abstract
Freeform surfaces play an important role in modern optical systems with compactness and better performance. The fabrication tools tend to impart a structured signature on optical surfaces, called ripple errors, during the freeform surface manufacturing process. The description and extraction of ripple errors for freeform surface fabrication and testing have attracted extensive attention. In this paper, we develop a fast and accurate method to describe ripple errors for the large aperture based on Fourier model coupling. The polynomial expression is transformed into Fourier series form and surface errors are reconstructed by frequency feature extraction combining with the least square method. The high accuracy and efficiency of the proposed method for representing and filtering ripple errors consuming little computer memory are demonstrated using real experimental data. The proposed method offers a robust and powerful tool not only suitable for surface error characterization but also for image filtering and analysis.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
