Abstract
Structured-light systems consisting of a camera and projector are powerful and cost-effective tools for three-dimensional (3-D) shape measurements. However, most commercial projectors are unable to generate distinct patterns due to defocusing and shallow focusing issues. We propose a hybrid method for enhancing the calibration and scanning features of the defocusing structured-light 3-D scanning system. Instead of using conventional sequential binary patterns, we replace the highest-level binary pattern by a high-order sinusoidal pattern. In our proposed system, a pan-tilt stage carrying a checkerboard is used to assist the simultaneous calibration of the camera and projector. Initially, the camera is calibrated to obtain the extrinsic positions of the stage. In addition, we utilize the multiplication of vertical and horizontal stripe patterns to enhance the corresponding features between the camera and projector. The projector is then calibrated using the extrinsic features determined from the calibrated camera. The experimental results show that the use of the high-order sinusoidal pattern significantly improves reprojection error. Our proposed method can easily be incorporated in the defocusing projector for scanning various types of objects.
Highlights
Optical three-dimensional (3-D) measuring systems have reached the mainstream for 3-D shape measurements, and they have been widely adopted in various fields.[1]
This study considered a robust method for overcoming potential problems caused by the projector optics mechanism, such as the small depth of focus, nonuniform brightness distribution, low resolution, and low modulation transfer function (MTF)
A 3M-pixel camera manufactured by Pointgrey (FL3-U3-32S2M-CS) was used with an additional digital light projector (DLP) (VIVITEK UMI-Q5), which has a native resolution of 912 × 1140 pixels
Summary
Optical three-dimensional (3-D) measuring systems have reached the mainstream for 3-D shape measurements, and they have been widely adopted in various fields.[1] The existing 3-D measurement techniques can be categorized according to several types, such as stereoscopy, laser triangulation, structured light or fringe projection, and time of flight (ToF). All of these methods have been extensively employed due to their noncontact and nondestructive features with regard to the physical probes of the coordinate measurement machine (CMM). Precise subpixel localizations of stripes can be obtained using super-resolution algorithms.[2]
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