Abstract

This issue's Feature Article reports on the current achievements of structuring fused silica and crystal quartz materials on the micrometer scale by excimer laser ablation techniques [1]. It discusses the characteristics of direct ablation as well as the more specialized methods of laser-induced backside wet etching and laser-induced plasma-assisted ablation. As an example of such high-precision, high-quality structures, the cover picture shows a set of scanning electron microscopy images of the morphologies of different patterns ablated on quartz substrates by an ArF excimer laser. These micro-structures were ablated using the 193 nm line of an excimer laser at a fluence of 3.4 J/cm2 with 100 pulse shots. The cover picture was contributed by Ying-Tung Chen, Chung Cheng Institute of Technology (Taiwan). The Feature Article is authored by Ampere A. Tseng, who is a professor at the Department of Mechanical and Aerospace Engineering of Arizona State University. His main research interests lie with micro- and nanofabrication of various devices and systems. The issue also includes an Editor's Choice article presenting experimental results on laser-assisted debonding of GaN high electron mobility transistors [2]. The authors show how the laser-assisted debonding process can be accomplished without compromising the electrical device characteristics or the material defect density.

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