Abstract

Dielectric materials are used in many application areas. This paper introduces the application of a three-dimensional (3D) capacitance CT for non-destructive evaluation of dielectric materials. The volumetric image of dielectric permittivity of the object is generated using the capacitance measurement data using an inverse finite element technique. The dielectric material inspection results in this work are presented by identifying the presence of air volumes (defects) inside a dielectric object. A sensor array has been designed and fabricated for the non-destructive testing application of capacitance CT. The paper presents both synthetic and experimental results.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.