Abstract
Fe films grown on clean diamond (100) have been studied using synchrotron-based X-ray photoemission spectroscopy (XPS) and ultra-violet photoemission spectroscopy (UPS). The work function and secondary electron yield (SEY) in UPS of the sample were found to change strongly as Fe film thickness increases. After the deposition of about one monolayer Fe, which was found to react with diamond by XPS, work function reaches its minimum while SEY reaches its maximum due to the formation of a dipole layer between the chemisorbed Fe and C atoms at the interface. This study could help the development of high emittance spin-polarized electron source based on magnetic thin films grown on diamond with low or negative electron affinity.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
More From: Advances in Synchrotron Radiation
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
