Abstract
In the paper the application of the SVM (support vector machine) algorithm has been used for diagnosis and test of analog electronic circuits in time domain. Procedure designed belongs to simulation before test technique, where the fault models should be assumed at the before test stage (prototype stage). Both, parametric and catastrophic faults based on standard fault models are considered. Selected features from transient domain are classified at the after test stage with use of decision function, which has been designed by SVM algorithm. An exemplary benchmark has been tested and the results prove high classification ability of the SVM application.
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