Fault root cause analysis using degree of change and mean variable threshold limit in non-linear dynamic distillation column

Abstract

The chemical industrial processes are both dynamic and complex. The presence of instability and danger in the production process poses significant challenges to safety management. Early and accurate fault diagnosis is essential to ensure a sustainable and stable chemical process performance. Most studies in literature do not provide detailed information about diagnosing the root cause of faults in distillation columns using contribution plots. Using principal component analysis (PCA) in conventional contribution plots leads to a large number of contributing variables, making it difficult to identify the root cause of a specific fault. In this study, the authors suggest employing the Degree of Change of Contribution Values (DCC) and Mean Variable Threshold Limit (LMVT) techniques alongside the Wavelet Transform-Principal Component Analysis (WT-PCA) method to decrease the quantity of fault identification variables in a non-linear system (distillation column). The Aspen Plus software is utilized to perform a dynamic simulation of a distillation column, generating data for both normal and faulty operations. Two distinct types of faults are considered, which include loss of feed flow and feed temperature changes. This study aims to analyze the results obtained from the Hotelling T2 and SPE contribution plots by calculating the average difference between the normal and faulty conditions using the Degree of Change in Contribution Values. This procedure is performed to determine the extent of deviation from the standard state. Subsequently, the variables that have surpassed the threshold limit for means variables (LMVT) are designated as the variables that serve as the primary underlying cause of the fault. The technique was employed in a case study involving a nonlinear distillation column, and the results indicate that only one "dominant" variable intersects the LMVT by Hotelling T2, which represents the true underlying cause of the corresponding fault.