Fault prediction of electronic devices based on attention mechanism time-series point process

Abstract

In recent years, with the development of high-precision sensors, computer technology and artificial intelligence, it makes the data-driven intelligent fault warning and diagnosis method gradually become a research hotspot. Aiming at the low utilization of fault diagnosis information of complex electronic devices and the problems of convergence and training time of traditional neural network fault diagnosis models, a point-in-time process generation model without using intensity function is proposed. The model uses the Wasserstein distance to construct the loss function, which facilitates the measurement of the deviation between the model distribution and the true distribution, and uses a self-concern mechanism to describe the degree of influence of the historical events on the current events, which makes the model interpretable and more capable of generalization. Comparative experiments show that without a priori information about the intensity function, the method reduces the relative error rate by 3.59 %, improves the fault prediction accuracy by 3.91 %, and has a better overall fit than the RNN-like generative model and the great likelihood model. Example analysis shows that the model has good prediction accuracy and provides a feasible solution for real-time fault diagnosis of complex electronic devices.