Fault modeling for external energy or internal cell defect in quantum dot cellular automata

Abstract

Nanotechnology has made the circuits more susceptible to errors. It takes a lot of space and power to make sequential reversible circuits testable using one of the conventional methods (such as cascading gates with the original circuit). I suggest a superior testing strategy for sequential circuits based on conservative logic. The primary goal of this effort is to create a testable sequential circuit that is compact in terms of circuit area and other cost parameters. My method does not require changing the original circuit. So, incorporating testable features using the proposed method does not affect the complexity of the overall circuit. In this work, stuck-at-fault modeling for external unwanted energy or internal cell defect in low-power molecular QCA is also derived. The reversible double-edge triggered (DET) flip-flop is tested using the suggested approach. The proposed methodology can still be applied to achieve 100% fault coverage for unidirectional stuck-at-fault in quantum cellular automata (QCA) designs. The design is assigned into practice using a layered technique since it is more reliable and economical.