Fault Detection in Semiconductor Industry: ABCtronics

Abstract

The high prevalence of electronic devices over the past fifty years has fueled the extraordinary rise of the semiconductor industry. The manufacture of semiconductor wafers is a time-consuming and delicate process in which defects might arise and cause the failure of the entire circuit. As more complicated devices generate flaws that are tiny and harder to detect [8], innovations in wafer defect inspection technologies are in high demand. Traditional machine learning approaches, such as univariate and multivariate analyses, have been utilized for a long time as a method for developing defect detection models [3][4]. The virtual firm and data resource are provided by case of virtual company ABCtronics. Nonetheless, obstacles provide possibilities for creativity. In the face of the development of technology, a company's troubles have equal potential to completely wipe it out and propel it to success. The focus of this investigation is on the limitations of the technologies currently used in semiconductor manufacture. The research concludes that loyal clients lead to successful businesses.