Abstract

ABSTRACTThe increased component requirement to realise multilevel inverter (MLI) fallout in a higher fault prospect due to power semiconductors. In this scenario, efficient fault detection and diagnosis (FDD) strategies to detect and locate the power semiconductor faults have to be incorporated in addition to the conventional protection systems. Even though a number of FDD methods have been introduced in the symmetrical cascaded H-bridge (CHB) MLIs, very few methods address the FDD in asymmetric CHB-MLIs. In this paper, the gate-open circuit FDD strategy in asymmetric CHB-MLI is presented. Here, a single artificial neural network (ANN) is used to detect and diagnose the fault in both binary and trinary configurations of the asymmetric CHB-MLIs. In this method, features of the output voltage of the MLIs are used as to train the ANN for FDD method. The results prove the validity of the proposed method in detecting and locating the fault in both asymmetric MLI configurations. Finally, the ANN response to the input parameter variation is also analysed to access the performance of the proposed ANN-based FDD strategy.

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