Abstract
This paper presents the fatigue analysis of the top part of micro contact cell via the constant amplitude loading of new electrical conductive cell contact using micro-structures. The cell is purposely developed to replace the pogo pin used in the assembly line of semi-conductor industry. The new design of micro contact cell utilizes different concept with the typical mechanism of pogo pin nowadays. The development of the cell is using a quasi-solid material as a function of spring mechanism. There are a number of studies giving promising results regarding the design of micro contact cell. This study determines the fatigue failure of micro-contact pins in order to analyze the reliability of the cell under the load of repetitive condition. This study also monitors the fatigue life of micro contact under certain parameters of the constantly repeated loading and suggests the most suitable pin number according to fatigue analysis. The fatigue lives of four (4) models of micro contact cell with different number of pins are studied. The results obtained from the study shows that 16-pin model of micro contact cell is the most reliable and robust design for the repetitive application.
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