Fast SEU fault injection in the SoC-memory

Abstract

In this paper the SoC-microprocessor testing problem using SEU fault injection in the SoC-memory is considered. It is substantiated the minimal time delay of fault injection is a necessity for some tests. We overview the current approach to SEU fault injection ensuring the minimal time delay. It is offered the fault injection method in the SoC-microprocessors using the on-chip fault injector. Possibilities of the proposed method are suggested. By way of illustration the injection in LEON3 SoC-microprocessor is regarded. The general injection algorithm is described. The outcome of experiment supported the injection minimal time delay are given.