Abstract
The use of an autoneutralizing fast neutral SF 6 beam (FNB) for secondary ion quadrupole mass spectrometry of refractive samples has been demonstrated previously. Here, we demonstrate the FNB technique for generation and high-resolution Fourier transform ion cyclotron resonance (FT-ICR) mass spectrometric detection of ions from a wide variety of samples. The fast neutral beam generates abundant secondary ions from both conductive and insulating samples for detection in an open-ended ICR ion trap, as demonstrated by representative mass spectra of methyl stearate, fluorocarbon polymers, gramicidin S, and fullerenes. Optimization of the FNB-FT-ICR-MS experiment is discussed in detail, with particular emphasis on analysis of insulating materials which are not readily analyzed by ion-bombardment secondary ion mass spectrometry.
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