Abstract
We have completed a deperturbation analysis of a set of measurements in SiO + including seven bands of the B 2Σ +- X 2Σ + system, the (2, 0) Ω = 1 2 sub-band of the B 2Σ +- A 2Π system, and fine structure intervals of the ν = 0 level of the X 2Σ + state. The pattern of perturbations in the B- X system shows that the assignments of vibrational levels in the A 2Π state made in earlier photoelectron spectroscopy work are incorrect. Deperturbed molecular constants for the three electronic states have been derived.
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