Abstract
The characterization of communication devices in a certain frequency band can be accelerated if a fast frequency sweep technique is used instead of a discrete frequency sweep. Existing fast frequency sweep techniques are either complex or specific for a certain electromagnetic solver. In this work, a new fast frequency sweep method is proposed that consists in segmenting the device under analysis into simple building blocks. Each building block is characterized with a generalized (multimode) circuital matrix whose elements present a simple and flat frequency response that is interpolated using natural cubic splines with very few points. In this way, the response of each block along the whole frequency band is obtained efficiently and accurately with as many frequency points as desired. Then, the circuital matrices of all the blocks are cascaded and the circuital matrix of the whole device in obtained. The new fast frequency sweep was successfully applied to the analysis of different types of devices (all metallic rectangular waveguide filter, dielectric loaded rectangular waveguide filter, and substrate integrated waveguide filter). The computational times were reduced to 15% or 19%, depending on the device, when compared with a discrete frequency sweep using the same electromagnetic solver.
Highlights
Characterizing the performance of communications devices in a certain frequency band can be done by discretizing the frequency band into a number of discrete points, and repeatedly characterizing the response of the device in each one of these points
We present a simple, non-intrusive, and solver independent fast frequency sweep technique, which takes profit of the segmentation of the structure under analysis into simple constitutive blocks
To test the performance of this new fast frequency sweep technique, it was applied to the computation of the frequency response of several devices: an all-metallic coupled cavities filter in rectangular waveguide, a coupled cavities filter in rectangular waveguide with dielectric posts loading each resonator, and a coupled cavities filter in substrate integrated waveguide (SIW)
Summary
Characterizing the performance of communications devices in a certain frequency band can be done by discretizing the frequency band into a number of discrete points, and repeatedly characterizing the response of the device in each one of these points. To test the performance of this new fast frequency sweep technique, it was applied to the computation of the frequency response of several devices: an all-metallic coupled cavities filter in rectangular waveguide, a coupled cavities filter in rectangular waveguide with dielectric posts loading each resonator, and a coupled cavities filter in substrate integrated waveguide (SIW). These devices were selected to have a wide variety of possible simple building blocks (irises, dielectric posts, and metallic vias), in order to ensure that the method produces good results in all cases. An accurate result with very little computational cost was obtained
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