Abstract
The quality of the scanning tip is crucial for tip-enhanced Raman spectroscopy (TERS) experiments towards large signal enhancement and high spatial resolution. In this work, we report a controllable fabrication method to prepare TERS-active tips by modifying the tip apex at the atomic scale, and propose two important criteria to in-situ judge the tip's TERS activity for tip-enhanced Raman measurements. One criterion is based on the downshift of the first image potential state to monitor the coupling between the far-field incident laser and near-field plasmon; the other is based on the appearance of the low-wavenumber Raman peaks associated with an atomistic protrusion at the tip apex to judge the coupling efficiency of emissions from the near field to the far field. This work provides an effective method to quickly fabricate and judge TERS-active tips before real TERS experiments on target molecules and other materials, which is believed to be instrumental for the development of TERS and other tip-enhanced spectroscopic techniques.
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