Fast electron and X-ray scattering as a tool to study target's structure

Abstract

We concentrate on several relatively new aspects of the study of fast electron and X-ray scattering by atoms and atom-like objects, namely endohedral atoms and fullerenes. However, main attention is given to fast charge particle scattering. We show that the corresponding cross-sections, being expressed via so-called generalized oscillator strengths (GOS), give information on the electronic structure of the target and on the role of electron correlations in it. We consider what sort of information became available when analyzing the dependence of GOS upon their multipolarity, transferred momentum q and energy ω. To obtain theoretical results, we employ both the one-electron Hartree–Fock approximation and account for the multi-electron correlation in the target, using the random phase approximation with exchange. We demonstrate the role of non-dipole corrections in the small-angle fast-electron inelastic scattering. There dipole contribution dominates while non-dipole corrections can be considerably and controllably enhanced as compared to the case of low and medium energy photoionization. We show also that analyses of GOS for discrete level excitations permit to clarify their multipolarity. The results of calculations of Compton excitation and ionization cross-sections are presented. Attention is given to cooperative effects in inelastic fast electron-atom scattering that results in directed motion of the secondary electrons, a phenomenon that is similar to “drag currents” in photoionization. We demonstrate how one should derive GOS for endohedral atoms, e.g. A@ C 60 and what is the additional information that can be obtained from corresponding GOS. Most of discussions are illustrated by the results of concrete calculations.