Fast electromagnetic imaging of thin inclusions in half-space affected by random scatterers

Abstract

We consider an inverse scattering problem wherein penetrable thin electromagnetic inclusions completely embedded in a half-space are surrounded by randomly distributed scatterers. A non-iterative algorithm for retrieving the shape of the inclusions is discussed. It is based on the fact that Multi-static Response (MSR) matrix data can be modeled via a rigorous asymptotic expansion formula of the scattering amplitude in the presence of the inclusions. Various numerical implementations show that the proposed algorithm performs satisfactorily for single and multiple thin inclusions, even with a fair number of random scatterers affecting the data.