Abstract

Sodium ion secondary battery (SIB) is a low-cost and ubiquitous secondary battery for next-generation large-scale energy storage. The diffusion process of large Na+ (ionic radius is 1.12 Å), however, is considered to be slower than that of small Li+ (0.76 Å). This would be a serious disadvantage of SIB as compared with the Lithium ion secondary battery (LIB). By means of the electrochemical impedance spectroscopy (EIS), we determined the diffusion constant (D) of Na+ in thin films of O3- and P2-type NaCoO2 with layered structures. We found that the D values (~ 0.5–1.5 × 10−10 cm2/s) of Na+ are higher than those (< 1 × 10−11 cm2/s) of Li+ in layered LiCoO2. Especially, the D values of O3-NaCoO2 are even higher than those of P2-NaCoO2, probably because O3-NaCoO2 shows successive structural phase transitions from the O3, O’3, P’3, to P3 phases with Na+ deintercalation. We further found that the activation energy (ED ~ 0.4 eV) for the Na+ diffusion is significantly low in these layered cobalt oxides. We found a close relation between the relative capacity and the renormalized discharge rate ( = L2/DT, where L and T are the film thickness and discharge time, respectively).

Highlights

  • Sodium ion secondary battery (SIB) is a low-cost and ubiquitous secondary battery for next-generation large-scale energy storage

  • The diffusion process of large Na1, is considered to be slower than that of small Li1 (0.76 A ). This would be a serious disadvantage of SIB as compared with the Lithium ion secondary battery (LIB)

  • We found that the D values (, 0.5–1.5 3 10210 cm2/s) of Na1 are higher than those (, 1 3 10211 cm2/s) of Li1 in layered LiCoO2

Read more

Summary

Correspondence and requests for materials should be addressed to

Sodium ion secondary battery (SIB) is a low-cost and ubiquitous secondary battery for next-generation large-scale energy storage. By means of the electrochemical impedance spectroscopy (EIS), we determined the diffusion constant (D) of Na1 in thin films of O3- and P2-type NaCoO2 with layered structures. The EIS curves of P2-NaxCoO2 (x 5 0.5) show no bending behavior in the low frequency region in the temperature range from 303 K to 349 K (Fig. S6) This implies that the D value at x 5 0.5 is much higher than those at x 5 0.54 2 0.72. The D values of O3-NaCoO2 are even higher than those of P2-NaCoO2 This is probably because oxidized O3NaxCoO2 film (0.5 , x , 0.83) contains the P3-type host framework with oxygen prisms. The EIS data were analyzed by Randles equivalent circuit [see Fig. 2(a)] with high frequency resistance of electrolyte (Ro), ionic charge-transfer resistance (Rct), double layer capacitance (Cdl), and restricted diffusion impedance [Rd. The seven parameters, i.e., Ro, Rct, Cdl, RD, a, n, and D, were determined by least-squares fittings of the EIS curves

Method
Author contributions
Additional information
Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call