Abstract
Protection from over-current situations and the resulting risk of device failure is a requirement when testing limited-run, experimental modules. This paper demonstrates a fast, configurable, and consistent means for protecting against over-current conditions during Clamped Inductive Load (CIL) testing of 10 kV SiC MOSFET modules. This protection circuit offers the user a convenient method of selecting a desired trip current. The protection circuit is able to sense current in the power loop of the CIL test stand, and will interrupt power to the device-under-test (DUT) upon detecting an over-current condition. A method of predicting and compensating the small delay introduced by the gate drive of the protection circuit is also demonstrated.
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