Fast and accurate detection of surface defect based on improved YOLOv4

Abstract

PurposeThe current popular image processing technologies based on convolutional neural network have the characteristics of large computation, high storage cost and low accuracy for tiny defect detection, which is contrary to the high real-time and accuracy, limited computing resources and storage required by industrial applications. Therefore, an improved YOLOv4 named as YOLOv4-Defect is proposed aim to solve the above problems.Design/methodology/approachOn the one hand, this study performs multi-dimensional compression processing on the feature extraction network of YOLOv4 to simplify the model and improve the feature extraction ability of the model through knowledge distillation. On the other hand, a prediction scale with more detailed receptive field is added to optimize the model structure, which can improve the detection performance for tiny defects.FindingsThe effectiveness of the method is verified by public data sets NEU-CLS and DAGM 2007, and the steel ingot data set collected in the actual industrial field. The experimental results demonstrated that the proposed YOLOv4-Defect method can greatly improve the recognition efficiency and accuracy and reduce the size and computation consumption of the model.Originality/valueThis paper proposed an improved YOLOv4 named as YOLOv4-Defect for the detection of surface defect, which is conducive to application in various industrial scenarios with limited storage and computing resources, and meets the requirements of high real-time and precision.