Fast analysis of microwave integrated circuits by use of the inner‐outer flexible GMRES‐FFT method

Abstract

AbstractIn this paper, the microstrip circuit is analyzed in terms of the mixed potential integral equation (MPIE) by using the rooftop‐function expansion and the blaze‐function testing technique. The integral equation is solved by the inner‐outer flexible generalized minimal residual fast Fourier transform (FGMRES‐FFT) method. Our numerical calculations show that the FGMRES‐FFT method can converge as high as five times faster than the generalized minimal residual‐fast Fourier transform (GMRES‐FFT) method and 16 times faster than the conjugate gradient‐fast Fourier transform (CG‐FFT) method. Some typical microstrip discontinuities are analyzed and the good results obtained demonstrate the validity of the proposed algorithm. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 409–413, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20485