Fast & accurate algorithm for jitter test with a single frequency test signal

Abstract

A fast and accurate algorithm for jitter test is presented. The proposed method uses a single test with a high frequency input sine wave. Elimination of the need of a 2nd low frequency test required in the IEEE standard test offers significant savings on both hardware and data acquisition time. The new method is computationally efficient since it requires only one FFT together with some simple time domain computation. Furthermore, there are no nonlinear operations involved, avoiding errors inherently associated with such operations. Theoretical analysis, extensive simulation results, and experimental results validated the computational efficiency and test accuracy. The new algorithm is also shown to be robust with respect to harmonic and non-harmonic distortions. The algorithmic simplicity and the relaxed hardware requirement make the new method well suited for built-in self test.