Abstract
Optical fringe pattern processing and analysis [1] plays crucial role in metrological applications (e.g., interferometry, moire and structured illumination methods). It might be often a troublesome task because of fringe pattern defects such as noise, uneven background, low modulation and generally complex fringe shapes in a wide spatial frequency range. In this paper we present adaptive optical fringe pattern processing (filtering and normalization) techniques, robust to mentioned pattern imperfections, based on the empirical mode decomposition (EMD).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
