Fast acquisition protocol for X-ray scattering tensor tomography

Jisoo Kim,Federica Marone,Matias Kagias,Marco Stampanoni,Zhitian Shi

doi:10.1038/s41598-021-02467-w

Abstract

Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. X-ray scattering tensor tomography with the use of this circular grating array has been demonstrated. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

Highlights

Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials
Comparative analyses were presented for simple acquisition protocols optimally suited for rapid scattering tensor tomography
The null space was significantly reduced by substituting conventional linear with circular gratings already when the tilt angles or the number of spiral turns n were just 1. This first mathematical evidence highlighted the potential of using a circular grating array for fast scattering tensor tomography with simple acquisition geometries with a fairly small n

Summary

Introduction

Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are rapid and corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. SAXS contrast can mitigate the trade-off between the length-scale of interest and the FOV, facilitating full correlative studies of the micro- and nano-structure over macroscopic sample volumes[7,8]. A set of coefficients of the scattering tensor which models the 3D scattering distribution of the underlying microstructure is reconstructed in each voxel[12,13,14,15]

Methods

Results

Discussion

Conclusion