Abstract
A Fourier transform technique is applied to derive expressions for the diffraction field due to elliptical apertures and its annulli. Perspective plots of the intensity distribution diagrams are generated for various values of the axis ratio with the help of an IBM-370/168 computer. All possible cases are discussed briefly.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
