Abstract
This paper presents a new approach to derive far-field data needed in antenna and EMI/EMC testing from near-field measurements. An exact integral equation solution to the wave propagation problem is used to transform the near-field data to the far field. The method requires near-field measurements on two closed surfaces enclosing all sources and inhomogeneities. The approach is validated with numerical simulation of measurements of fields radiated from a known antenna. >
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