Abstract
Tomographic diffraction microscopy is a three-dimensional quantitative optical imaging technique in which the sample is numerically reconstructed from tens of holograms recorded under different angles of incidence. We show that combining the measurement of the amplitude, the phase, and the polarization of the field scattered by the sample with an approximate knowledge of the sample permittivity allows reconstruction of spatially complex samples up to 50 nm resolution. This technique should be particularly useful for imaging objects made of known materials.
Highlights
The resolution of diffraction microscopy is fundamentally limited by the elastic light–matter interaction
The Abbe limit states that, in the single scattering regime, the far field scattered by an object illuminated under propagative waves conveys information on the spatial frequencies of the sample permittivity distribution up to 2∕λ at most
The permittivity distribution ε r within a bounded investigating domain Ω was reconstructed from the scattered farfield data using a reconstruction algorithm, hereafter called the bounded inversion method (BIM), which took advantage of the knowledge of the object and background relative permittivity values, εref and εbackground, respectively
Summary
The resolution of diffraction microscopy is fundamentally limited by the elastic light–matter interaction. The Abbe limit states that, in the single scattering regime, the far field scattered by an object illuminated under propagative waves conveys information on the spatial frequencies of the sample permittivity distribution up to 2∕λ at most (where λ is the illumination wavelength in the background medium).
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