Abstract
We report on experimental observation of the far-field intensity and mode distributions of random lasers. Laser emission from highly disordered semiconductor polycrystalline thin films could be observed in all directions. The angle dependence of the laser output from the edge of the film is different from that of the laser emission scattered out of the surface of the film. More lasing modes are observed from the surface of the film than from the edge of the film. A qualitative explanation of the experimental results are presented based on the laser cavities formed by optical scattering being located in the plane of the films.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
