Abstract
We investigate theoretically and experimentally Fano resonances in integrated silicon Bragg reflectors. These asymmetric resonances are obtained by interference between light reflected from the Bragg waveguide and from the end facet. The Bragg reflectors were designed and modeled using the 1D transfer matrix method, and they were fabricated in standard silicon wafers using a CMOS-compatible process. The results show that the shape and asymmetry of the Fano resonances depend on the relative phase of the reflected light from the Bragg reflectors and end facet. This phase relationship can be controlled to optimize the lineshapes for sensing applications. Temperature sensing in these integrated Bragg reflectors are experimentally demonstrated with a temperature sensitivity of 77 pm/°C based on the thermo-optic effect of silicon.
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