Abstract
Voltage regulator (VR) stability plays an essential role in ensuring maximum power delivery and long-lasting electronic lifespan. Capacitor with a specific equivalent series resistance (ESR) range is typically connected at the VR output terminal to compensate for instability of the VR due to sudden changes in load current. The stability of VR can be measured by analyzing output voltage during load transient tests. However, the optimum ESR range obtained from the ESR tunnel graph in its datasheet can only be characterized by testing a set of data points consisting of ESR and load currents. Characterization process is performed manually by changing the value of ESR and load current for each operating point. However, the inefficient process of estimating the critical value of ESR must be improved given that it requires a large amount of time and expertise. Furthermore, the stability analysis is currently conducted on the basis of the number of oscillation counts of VR output voltage signal. Therefore, a model-based virtual sensing approach that mainly focuses on black-box modeling through system identification method and training neural network on the basis of estimated transfer function coefficients is introduced in this study. The proposed approach is used to estimate the internal model of the VR and reduce the number of data points that need to be acquired. In addition, the VR stability is analyzed using noninvasive stability measurement method, which can measure phase margin from the frequency response of the VR circuit in closed-loop conditions. Results showed that the proposed method reduces the time it takes to produce an ESR tunnel graph by 84% with reasonable accuracy (MSE of 5×10−6, RMSE of 2.24×10−3, MAE of 1×10−3, and R2 of 0.99). Therefore, efficiency and effectiveness of ESR characterization and stability analysis of the VR circuit is improved.
Highlights
Increasing demand for electronic products, such as systemon-chips and personal electronics, commonly requires the use of a voltage regulator (VR) for stable and regulated output voltage supply
VRs in electronic devices are embedded in an integrated circuit (IC), but fault probability of the VR can be influenced by a few parameters, such as temperature, input voltage supply, and aging factors [3],[5],[6]
This stage phase aims to produce a benchmark for the equivalent series resistance (ESR) tunnel graph that depicts stable and unstable regions of operating data points
Summary
Increasing demand for electronic products, such as systemon-chips and personal electronics, commonly requires the use of a voltage regulator (VR) for stable and regulated output voltage supply. VRs in electronic devices are embedded in an integrated circuit (IC), but fault probability of the VR can be influenced by a few parameters, such as temperature, input voltage supply, and aging factors [3],[5],[6]. These factors may further deteriorate internal parameters and reduce the performance of electronic devices or completely eliminate their functionality [21]. This situation occurs because an internal model for the VR is lacking and product variations may cause parameters inside the VR to vary. An efficient and accurate failure region estimation method is necessary under the condition that the actual model is known
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